Deakin University Australia

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Microscopy

Microscopy

There are three different microscopes available in the lab which cover the scale of magnification from macro to nano.

Olympus SZ61 TR Macroscope

Equipment	Olympus SZ61 TR Macroscope
Magnification	X0.67X – X4.5
Specifications	Working distance = 110mm Tube tilting angle = 45° Eyepieces = WHSZ10X-H FN 22* *Please see instructional manual for more details
Location	KE2.101
Booking address	*G SEBE ENG Lab Eqpmt KE2.101 Macro-scope
SOP	Olympus SZ61 Macroscope SOP (PDF, 139.5KB)
Instruction manuals	Olympus SZ61 Macroscope (PDF, 692.6KB)

Olympus GX41 Inverted Microscope

Equipment	Olympus GX41 Inverted Microscope
Magnification	X50, X100, X200, X1000
Specifications	Working distance = dependant on objective in use* Observation tubes = U-CTR30-2* Objectives = MPLN X5, X10, X20, X100* Eyepieces = WHB10X FN 20* *Please see instructional manual for more details
Location	KE2.101
Booking address	*G SEBE ENG Lab Eqpmt KE2.101 Optical Microscope
SOP	Olympus GX41 Inverted Optical Microscope SOP (PDF, 156.7KB)
Instruction manuals	Olympus GX41 Inverted Optical Microscope (PDF, 1.3MB)
Resources and information	Depth of focus (mm), field of view (mm) and working distance (mm) decreases with increase in magnification. Resolution (mm) increases with increase in magnification.

JEOL JSM-IT300

Equipment	JEOL JSM-IT300
Magnification	X5 to X300,000
Specifications	Imaging modes = Secondary electron image, Composition image, topographic image Resolution high vacuum mode - 3.0 nm (30 kV), 15.0 nm (1.0 kV) Resolution low vacuum mode - 4.0 nm (30 kV BED) Acceleration voltage = 0.3kV – 30kV Probe current = 1pA - 1mA Low vacuum pressure setting range = 10 – 650 Pa Maximum specimen = 200mm diameter, 80mm height (WD = 10mm) Image format = BMP, TIFF, JPEG
Location	KE2.103.02 Swipe access through technician only.
Booking address	*G SEBE ENG Lab Eqpmt KE2.103.02 SEM All bookings must be made with a technician.
SOP	JEOL SEM IT300 SOP (PDF, 278.1KB)
Instruction manuals	Available in the SEM Lab
Resources and information	A Guide to Scanning Microscope Observation Energy table for EDS Analysis Product details JEOL Resources Important notes Sample preparation must be completed at least 24 hours prior to microscopic analysis and kept in the desiccator cabinet in KE2.103.02 until analysis. Always wear gloves! The SEM is extremely sensitive to contamination. Gloves must be worn when touching your sample, sample holder, placing the sample holder into the instrument chamber, or cleaning the chamber seal. Resolution at any magnification, the beam size must be reasonably well-matched to the size of the pixel – otherwise a loss in sharpness or production of artefacts of the image results due to oversampling or under-sampling. Beam current is proportional to the probe diameter. The probe diameter must be smaller than the size of the features to imaged.

Last updated: 7 February, 2023 (1:13pm)

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